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Concept information

Término preferido

scanning electron microscopy  

Definición

  • A form of microscopy used to obtain images of microstructures, which utilises an electron gun to provide a beam of electrons which can be focussed on a specimen: the smaller the area to be scanned, the greater the magnification. Unlike its predecessor, transmission electron microscopy, where the beam is passed through the sample to produce an image on a flat plate, in sem the beam scans a small area of the solid specimen and secondary electrons are detected to form an image on a screen. [Source: Encyclopedia of Environmental Change; scanning electron microscopy]

Concepto genérico

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URI

http://data.loterre.fr/ark:/67375/N9J-FL67FFJ8-S

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